Abstract: Vibration mode scanning polarizing force microscope adopts a new scanning probe micro imaging method, which can freely switch between non-contact mode and tapping mode mediated by polarizing force. In the non-contact mode mediated by polarizing force, the polarizing force is superimposed on the van der Waals force, which overcomes the shortcomings of the general atomic force microscope (AFM) non-contact mode because the imaging force range is too short to be stable; by adjusting the needle tip The height, from the non-contact method mediated by the polarizing force to the tapping method mediated by the polarizing force, can partially eliminate the interference of the capillary force in the AFM tapping mode, and can also use the minimum stability than the AFM tapping mode. Imaging is performed with a smaller force.
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